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Advanced Quantum-Nano Materials & Optoelectronics Laboratory
 
 

QR code_Prof. Jihoon Lee

Kwangwoon Univ. KOR ver website

Kwangwoon Univ. Eng ver website

Kwangwoon College of Electronics and Informattion Engineering

Dept. of Electronics and Communications Engineering

 

University of Arkansas


Sam M. Walton College of Business

 

ERC 선도연구센터

BK 21 PLUS

Engineering Research Center, Holo-Digilog Human Media

Ministry of Science, ICT and Future Planning

Ministry Of Education

NIPA

KCC

Ministry of Education, Science and Technology

ITRC logo

ITRC Forum 2011

 

 

- Journal Editor -

 

3D Research

NRL cover

 

 

- Research Highlight -

 

(Journal cover, Metals) Volume 7 Issue 11 Evolution of Ternary AuAgPd Nanoparticles by the Control of Temperature, Thickness, and Tri-Layer (2017)

(Journal cover,
Metals)
Volume 7
Issue 11

(2017)

 

Journal Cover: Precise Control of Configuration, Size and Density of Self-assembled Au Nanostructures on 4H-SiC (0001) by Systematic Variation of Deposition Amount, Annealing Temperature and Duration

(Journal cover,
CrystEngComm)
Volume 18
Issue 19

(2016)

Journal cover,CrystEngComm Volume 16 Issue 21 (2014)

(Journal cover,
CrystEngComm)
Volume 16
Issue 21

(2014)

 

Physica Status Solidi (a)) Volume 209 issue 6

(Journal cover,
Physica Status Solidi (a))
Volume 209
Issue 6

(2012)

 

Journal cover, Physica Status Solidi (a) Volume 208 Issue 1 (2011)

(Journal cover,
Physica Status Solidi (a))
Volume 208
Issue 1

(2011)

 

( Journal cover, IEEE Transactions on Nanotechnology) Volume 9 Issue 2  (2010)
( Journal cover,
IEEE Transactions on Nanotechnology)
Volume 9
Issue 2

(2010)

 

Wiley's Material Science online portal, Materials Views

(Materials Views, Wiley's Material Science)
"Nano Rings and Nano Pyramids"
(2010)

 


(Journal cover, Physica Status Solidi (a)) Volume 207 Issue 2  (2010)
(Journal cover,
Physica Status Solidi (a))
Volume 207
Issue 2

(2010)

 

(Journal cover, Applied Physics Letters) Volume 89 Issue 20  (2006)
(Journal cover,
Applied Physics Letters)
Volume 89
Issue 20

(2006)

 



(2006 MRS Fall Meeting Scene)
"Self-Assembly of InGaAs Quantum Dot Molecules (QDMs)"
(2006)

 

(Journal cover, Applied Physics Letters) Volume 88 Issue 23  (2006)

(Journal cover,
Applied Physics Letters)
Volume 88
Issue 23

(2006)

 

www.nanowerk.com

(NanoWerk, Spotlight)
"Quantum dot necklaces and other QD chains"
(April 12, 2006)

 

 

 

RESEARCH INSTRUMENTS

 


PL/Raman/ATR combined system

PL/Raman/ATR combined system

< PL/Raman/ATR combined system: Prof. Jihoon Lee’s group at Kwangwoon Univ.

 


PL (photoluminescence):

Photoluminescence (abbreviated as PL) is light emission from any form of matter after the absorption of photons (electromagnetic radiation).

Raman spectroscopy:

Raman spectroscopy (named after Sir C. V. Raman) is a spectroscopic technique used to observe vibrational, rotational, and other low-frequency modes in a system.

ATR (Absorption Transmittance Reflectance)

In physics, absorption of electromagnetic radiation is the way in which the energy of a photon is taken up by matter, typically the electrons of an atom.

In optics and spectroscopy, transmittance is the fraction of incident light (electromagnetic radiation) at a specified wavelength that passes through a sample.

Reflectivity or reflectance is the fraction of incident electromagnetic power that is reflected at an interface, in contrast to the reflection coefficient, which is the ratio of the reflected to incident electric field.

(Source: Wikipedia)

 

 

 

 

Energy Dispersive Spectrometer (EDS) System

Energy Dispersive Spectrometer (EDS) System

< Energy Dispersive Spectrometer (EDS) system: Prof. Jihoon Lee’s group at Kwangwoon Univ. >

 

Energy-dispersive X-ray spectroscopy

Energy-dispersive X-ray spectroscopy (EDS, EDX, or XEDS), sometimes called energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing unique set of peaks on its X-ray spectrum.

(Source: Wikipedia)

 

 

 

 

X-ray film measurement system

X-ray film measurement system

<X-ray film measurement system: Prof. Jihoon Lee’s group at Kwangwoon Univ. >

 

 

 

Pulsed Laser Depostion System (DaDa): Prof. Jihoon Lee’s group at Kwangwoon Univ.

Pulsed Laser Depostion System (DaDa): Prof. Jihoon Lee’s group at Kwangwoon Univ.

Pulsed Laser Deposition System: Prof. Jihoon Lee’s group at Kwangwoon Univ.

< PLD System: Prof. Jihoon Lee’s group at Kwangwoon Univ. >

 

PLD (Pulsed Laser Deposition)

Pulsed laser deposition (PLD) is a thin film deposition (specifically a physical vapor deposition, PVD) technique where a high-power pulsed laser beam is focused inside a vacuum chamber to strike a target of the material that is to be deposited.

This material is vaporized from the target (in a plasma plume) which deposits it as a thin film on a substrate (such as a silicon wafer facing the target). This process can occur in ultra high vacuum or in the presence of a background gas, such as oxygen which is commonly used when depositing oxides to fully oxygenate the deposited films.

(Source: Wikipedia)

 

 

 

 

Atomic Force Microscope (Parks XE-70): Prof. Jihoon Lee’s group at Kwangwoon Univ.

Atomic Force Microscope (Parks XE-70): Prof. Jihoon Lee’s group at Kwangwoon Univ.

Atomic Force Microscope (XE-70): Prof. Jihoon Lee’s group at Kwangwoon Univ.

< Atomic Force Microscope: Prof. Jihoon Lee’s group at Kwangwoon Univ. >

 

Atomic Force Microscope (AFM)

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig invented the atomic force microscope (also abbreviated as AFM) and the first experimental implementation was made by Binnig, Quate and Gerber in 1986. The first commercially available atomic force microscope was introduced in 1989. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. In some variations, electric potentials can also be scanned using conducting cantilevers. In more advanced versions, currents can be passed through the tip to probe the electrical conductivity or transport of the underlying surface, but this is much more challenging with few research groups reporting consistent data (as of 2004).

(Source: Wikipedia)

 

 

 

 

Scanning Electron Microscope (SEM) system: Prof. Jihoon Lee’s group at Kwangwoon Univ.

Scanning Electron Microscope (SEM) system: Prof. Jihoon Lee’s group at Kwangwoon Univ.

Scanning Electron Microscope (SEM) system: Prof. Jihoon Lee’s group at Kwangwoon Univ.

< Scanning Electron Microscope (SEM) system: Prof. Jihoon Lee’s group at Kwangwoon Univ. >

 

Scanning Electron Microscope (SEM)

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, in low vacuum, in wet conditions (in environmental SEM), and at a wide range of cryogenic or elevated temperatures.

(Source: Wikipedia)

 

 

 

 

High Power Nd:YAG laser

High Power Pulsed Laser system

High Power Pulsed Laser system

High Power Pulsed Laser system

Laser for PLD

High Power Pulsed Laser system (Continuum): Prof. Jihoon Lee’s group at Kwangwoon Univ.

< High Power Pulsed Laser system (Continuum): Prof. Jihoon Lee’s group at Kwangwoon Univ. >

 

 

 

 

 

 

< III-Arsenide Molecular Beam Epitaxy (solid source: Riber-32P): Dr. Salamo’s group at U of Arkansas >

< STM & MBE combined batch system >
(consisting 3 MBEs & 2 STMs & 1 SEM + STM system : Dr. Salamo’s group at U of Arkansas)

 

 

 

Nitride Molecular Beam Epitaxy (MBE: Veeco)

< III-Nitride Molecular Beam Epitaxy (Veeco): Dr. Salamo’s group at U of Arkansas >

 

Source cell before assembly

Source cell before assembly

<Source cells before assembly>

 

 

 

< Transmission electron microscopy (TEM) system: Dr. Salamo’s group at U of A >

 

 

 

Scanning Electron Microscope (SEM) system

< Scanning Electron Microscope (SEM) & Energy Dispersive X-ray microanalysis (EDX) system: Dr. Salamo’s group at U of Arkansas >

How does an EM (TEM-FESEM) work?
Source: Radboud University Nijmegen

 

 

 

< Focussed Ion Beam (FIB) system: Dr. Salamo’s group at U of Arkansas >

How does an FIB work?
Source: IBM

 

 

 

< X-ray Diffraction (XRD): Dr. Salamo’s group at U of Arkansas >

< Atomic Force Microscope (Veeco 3100): Dr. Salamo’s group at U of Arkansas >

 

How AFM works; source: MIT

 

 

 

< Photoluminescence (PL) setups: Dr. Salamo’s group at U of Arkansas >

 

 

 

< Fabrication laboratory: Dr. Salamo’s group at U of Arkansas >

 

 

< Clean room : HiDEC (The High Density Electronics Center) at U of Arkansas >

 

 
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